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Wednesday, Oct 8th
9:00am - 12:20pm MT
Test Vision: Day 1 - Session 1: Hardware
Location: North Building, 100 Level, Ballroom 120BC
Session Moderator (TV): Adrian Kwan – Advantest America Inc.
Test Vision
Sponsors
Wednesday, Oct 8th
9:00am - 9:10am MT
Welcome Remarks
Location: North Building, 100 Level, Ballroom 120BC
Session Moderator (TV): Alan Liao – FormFactor
Test Vision
Wednesday, Oct 8th
9:10am - 9:20am MT
Program Overview
Location: North Building, 100 Level, Ballroom 120BC
Session Moderator (TV): Lauren Getz – Teradyne
Test Vision
Wednesday, Oct 8th
9:20am - 9:50am MT
Best ATE Paper Award of 2024 Award and Presentation
Location: North Building, 100 Level, Ballroom 120BC
Session Moderator (TV): Paul Berndt – NW Test Engineering
Test Vision
Wednesday, Oct 8th
9:20am - 9:50am MT
2024 Best ATE Paper Award of 2024: From Lab to Line: Enabling Efficient PIC Testing for Mass Production
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Andy Chang – Marvell
Test Vision
Wednesday, Oct 8th
9:50am - 10:50am MT
Testing the Future: Collaborative Innovation in the AI Age
Location: North Building, 100 Level, Ballroom 120BC
Keynote Speaker (TV): Samer Kabbani – AEM
Test Vision
Wednesday, Oct 8th
10:50am - 11:05am MT
Design Optimization to mitigate Crosstalk for high-speed signals
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): KAVIYA RAVI – Advantest
Test Vision
Wednesday, Oct 8th
11:05am - 11:20am MT
Advanced Test Methodologies for High-Performance ADC and DAC Converters
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Daniele Varetto – SPEA S.p.A.
Test Vision
Wednesday, Oct 8th
11:20am - 11:35am MT
Advanced High-Voltage Testing Using Floating DC Resources
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Lauren Getz – Teradyne
Test Vision
Wednesday, Oct 8th
11:35am - 11:50am MT
High Bandwidth Scan Testing on Limited Interfaces
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Jason Doege – Siemens EDA
Test Vision
Wednesday, Oct 8th
11:50am - 12:05pm MT
Accelerating Semiconductor Test Development using Generative AI
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Navin Subramani – Soliton Technologies Inc
Test Vision
Wednesday, Oct 8th
12:05pm - 12:20pm MT
Session 1 Review + Raffle
Location: North Building, 100 Level, Ballroom 120BC
Session Moderator (TV): Junko Nakaya – Advantest America
Test Vision
Wednesday, Oct 8th
1:30pm - 3:10pm MT
Test Vision: Day 1 - Session 2: Test Development
Location: North Building, 100 Level, Ballroom 120BC
Session Moderator (TV): Lauren Getz – Teradyne
Test Vision
Wednesday, Oct 8th
1:30pm - 1:45pm MT
The Changing Culture of Test
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Ken Lanier – Teradyne
Test Vision
Wednesday, Oct 8th
1:45pm - 2:00pm MT
Implementing Effective Test Limits for Rapid Root-Cause Analysis in RMA Investigations
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Hailin Wang – ElevATE Semiconductor
Speaker (TV): David Chang – ElevATE Semiconductor
Test Vision
Wednesday, Oct 8th
2:15pm - 2:30pm MT
DFT Architecture Enabling Adaptive Test
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Preston McWithey – Siemens EDA
Speaker (TV): Steve Palosh – Siemens EDA
Speaker (TV): Pete Orlando – Siemens EDA
Test Vision
Wednesday, Oct 8th
2:30pm - 2:45pm MT
Using AI to Test AI: Accelerating Hill Climbing with Automated Evaluation of RAG-Based LLM Agents
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Brian Buras – Advantest
Test Vision
Wednesday, Oct 8th
2:45pm - 3:00pm MT
Session 2 review + Raffle
Location: North Building, 100 Level, Ballroom 120BC
Session Moderator (TV): Robert Schneider – Advantest
Test Vision
Wednesday, Oct 8th
3:00pm - 3:10pm MT
CAST Update: Metrology & AI Working Group
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Basak Ulutas Ozturkler – SEMI
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Test Vision Poster Session and Reception
Location: North Building, 100 Level, Ballroom 120BC
Session Moderator (TV): Stuart Pearce – AEM
Session Moderator (TV): Trent Weaver – Teradyne
Session Moderator (TV): Rick Marshall – PDF
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Accelerating Post-Silicon Validation with TestOps: A DevOps-Inspired, AI-Enabled Workflow
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Vijay Krishna Guru – Soliton Technologies
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Addressing the Dynamic Landscape of Post-Silicon Validation with A Standardized Software Framework
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Navin Subramani – Soliton Technologies Inc
Poster Presenter (TV): Dhibana Kesavan – Soliton Technologies Pvt Ltd
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Advanced inspection systems for next-generation photonic materials
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): John Byrnes – Semilab USA LLC
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
An FPGA-Based Neuromorphic-Deep Learning Fusion Architecture for Energy Efficient AI Applications
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Jaelyn S. Liang – UCSD Health
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
An Innovative Way to Achieve Lowest the Detection Limits in an All Hot Plasma via ICP-MS
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Bert Woods – Agilent Technologies
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Artificial Intelligence Agents Boost Engineer Productivity
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Andy Kittross – Teradyne
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Automated Testing of Large-Area Diamond Schottky Diode Arrays for Enhanced Manufacturability
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Trevor Thornton – Arizona State University
Poster Presenter (TV): Ankita Kashyap – Arizona State University
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Correlative Imaging Pipeline for High-Precision and Fast Test Metrology of TSV Arrays
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Pouya Tavousi – University of Connecticut
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Data Integrity and Device Handling Challenges For Expanded Wafer and Device Testing
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): JERRY BROZ – Gel-Pak, a Delphon Industries Company
Poster Presenter (TV): Victoria Tran – Gel-Pak, a Delphon Industries Company
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Domain Knowledge: The Key Ingredient to Effective and Sustainable Agentic Systems
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Navin Subramani – Soliton Technologies Inc
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Enhancing Acoustic Image Analysis Through Machine Learning
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Rebecca McCordic – Nordson
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Flying Probe Tester Solution for Advanced Package
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Takumi Kobayashi – HIOKI E.E. CORPORATION
Speaker (TV): Ivan DeGuzman – HIOKI E.E. CORPORATION
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
From Lab to Fab: Building the Collaborative R&D Engine for Materials Innovation
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Vidyut Gopal – EMD Electronics
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
GaN High Electron Mobility Transistors with Novel Dielectrics and Etching for Power Electronics
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Junzhe Xie – Arizona State University
Poster Presenter (TV): Ziyi He – Arizona State University
Poster Presenter (TV): Houqiang Fu – Arizaon State University
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
High Performance Compute: Advanced Packaging Impacts to Test Equipment
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Vineet Pancholi – Amkor Technology, Inc.
Poster Presenter (TV): YoungSoo Lee – Amkor Technology Inc.
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
High Voltage DUT Power Supply IC for Automotive Grade Testing
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Treasa S. Hlaing – ElevATE Semiconductor Inc.
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
High-Speed Photoluminescence Inspection for Killer Defect Detection/Binning in Power Semi Substrates
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): YU-HSIEN LIN – Onto Innovation
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
High-Temp Characterization of Monolayer MoSe₂ FETs for Extreme Environment Sensors & Electronics
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Yashvi Singh – Stanford Univeristy
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
High-Throughput Wafer Metrology: Roughness and Mechanical Mapping with Alphacen 300
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Edward Nelson – Nanosurf / SPEC-TII
Poster Presenter (TV): Dominik Ziegler – Nanosurf AG
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
High-Volume Manufacturing Testing for Silicon Photonics and Co-Packaged Optics: Gaps and Solutions
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Diwas Shrestha – Advantest Europe GmbH
Poster Presenter (TV): Michael Kwok – Advantest America Inc.
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
How Heterogeneous Integration Is Reshaping ATE Requirements
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Mason Lyu – Chroma ATE Inc.
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Improving Productivity in Test Program Management with GitHub Version Control
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Anastasiia Makhniaieva – ElevATE Semiconductor
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
In-Process Test Challenges in Hybrid Packaging Assembly
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Jeffrey hwang – ASE Group / CRD / Corporate Test R&D
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Josephson Junctions with high thermal stability for Superconducting Digital Logic
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Sarthak Hajirnis – University of Arizona
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Lattice Damage of GaN and HEMT Investigated by T-Ray Imaging and Deep-level Time-Domain Spectroscopy
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Anis Rahman – Applied Research & Photonics, Inc.
Poster Presenter (TV): Rick L. Wise – Applied Research & Photonics, Inc.
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Metrology Sensor Technology Significantly Improving Yields & Processes for Front-End Tools
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Vidya Vijay – Nordson
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Modernizing Post-Silicon Validation Using a GenAI-Based Agentic TestOps Ecosystem
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Govarthanam Krishnasamy – Soliton Technologies Pvt. Ltd.
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Optimizing Device Interface Board Design with Machine Learning for Analog and Digital Test Platforms
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Laura Rojas – Teradyne
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Revolutionizing AMS Chip Validation : AI Agent-Assisted Workflow for Validation Engineers
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Pearl He – Gubo Technologies
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Semiconductor Carrier Concentration and Transition Layer Profiling by T-ray Pump-Probe Interference
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Anis Rahman – Applied Research & Photonics, Inc.
Poster Presenter (TV): Rick L. Wise – Applied Research & Photonics, Inc.
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Testing AI: A Flood of Post-Selection Misconduct (P-Hacking) and a Holistic Solution
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): JUYANG WENG – GENISAMA
Poster Presenter (TV): Min Guo – GENISAMA
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
The Age of Singulated Die Test
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Brent Bullock – Advantest America Inc
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Total and Partial Vacuum Measurement: Verification for High-Purity Applications and Guard for Load Locks
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Klaus Bergner – VACOM
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Toward an Autonomous Test Decision Center: A Vision for Context-Aware Engineering Intelligence
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Deepshikha Shekhawat – Advanced Micro Devices
Poster Presenter (TV): Neeraj C. Shukla – Deloitte USA
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Ultrafast Laser-Based Sample Preparation: Enhancing FIB/SEM Workflows for High-Throughput Analysis
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Oytun Tasgit – 3D-Micromac AG
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Upskilling Test Engineers with AI
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Constantinos Xanthopoulos – Advantest America, Inc.
Test Vision
Wednesday, Oct 8th
3:10pm - 5:00pm MT
Vibe Coding in Practice: Accelerating Semiconductor Test Applications with LLMs
Location: North Building, 100 Level, Ballroom 120BC
Poster Presenter (TV): Benny Wang – Advantest
Test Vision
Thursday, Oct 9th
9:00am - 11:45am MT
Test Vision: Day 2 - Session 3: Test Analysis
Location: North Building, 100 Level, Ballroom 120BC
Session Moderator (TV): Rich L. Dumene – Renesas Electronics Corporation
Test Vision
Thursday, Oct 9th
9:00am - 10:00am MT
Test challenges in the era of 6G, AI & Disaggregation
Location: North Building, 100 Level, Ballroom 120BC
Keynote Speaker (TV): Octavio Martínez – Qualcomm
Test Vision
Thursday, Oct 9th
10:00am - 10:15am MT
Redefining Test Success: A Vision for Dynamic Key Performance Indicators in Semiconductor Operations
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Deepshikha Shekhawat – Advanced Micro Devices
Speaker (TV): Neeraj C. Shukla – Deloitte USA
Test Vision
Thursday, Oct 9th
10:15am - 10:30am MT
Cloud-IoT Integration for Real-Time Data-Driven Optimization in Semiconductor Test
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Fangmin Chu – Advantest
Test Vision
Thursday, Oct 9th
10:30am - 10:45am MT
Revolutionizing Semiconductor Design and Testing for AI and Cloud-Native Compute
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): yesh Kolla – Ampere Computing
Test Vision
Thursday, Oct 9th
10:45am - 11:00am MT
Accelerating Visual Test with Accessible AI for High-Accuracy Model Deployment
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Tareq Aljaber – Averroes.ai Inc.
Test Vision
Thursday, Oct 9th
11:00am - 11:15am MT
Leveraging ML to Detect Defective Dies in 3D Integrated Chips (3DICs)
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Jin Yu – Teradyne
Speaker (TV): Sandeep Kumar Goel – TSMC
Test Vision
Thursday, Oct 9th
11:15am - 11:30am MT
Session 3 Review + Raffle
Location: North Building, 100 Level, Ballroom 120BC
Session Moderator (TV): Padmanabha Srinivasamurthy – Teradyne
Test Vision
Thursday, Oct 9th
12:45pm - 4:05pm MT
Test Vision: Day 2 - Session 4: Silicon Photonics
Location: North Building, 100 Level, Ballroom 120BC
Session Moderator (TV): Preston McWithey – Siemens EDA
Test Vision
Thursday, Oct 9th
12:45pm - 1:30pm MT
Lessons from building an AI enabled equipment strategy
Location: North Building, 100 Level, Ballroom 120BC
Keynote Speaker (TV): Ian Mazsa – Cohu
Test Vision
Thursday, Oct 9th
1:30pm - 1:45pm MT
Innovative Testing Strategies for Si Photonic Devices in Engineering and Production Applications
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Dan Rishavy – FormFactor
Test Vision
Thursday, Oct 9th
1:45pm - 2:00pm MT
Transitioning from Copper to Optics: HVM-Scalable Test Solutions for CPO-based HPC Devices
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Ira H. Leventhal – Advantest America, Inc.
Test Vision
Thursday, Oct 9th
2:00pm - 2:15pm MT
Manufacturing Test Challenges for Co-Packaged Optics
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Vineet Pancholi – Amkor Technology, Inc.
Test Vision
Thursday, Oct 9th
2:15pm - 2:30pm MT
Scaling Photonics Test for the Next Decade: Lessons from Wafer to Co-Packaged Optics
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Matthew Griffin – Teradyne
Test Vision
Thursday, Oct 9th
2:30pm - 2:45pm MT
Advancing Defect Detection for 3D and Heterogeneous Semiconductor Systems
Location: North Building, 100 Level, Ballroom 120BC
Speaker (TV): Akshay Dipakkumar Harlalka – Atomic Machines Inc.
Test Vision
Thursday, Oct 9th
3:00pm - 3:15pm MT
Session 4 review + Raffle
Location: North Building, 100 Level, Ballroom 120BC
Session Moderator (TV): Basak Ulutas Ozturkler – SEMI
Test Vision
Thursday, Oct 9th
3:15pm - 4:00pm MT
Panel session: Test Technology in a Collaborative Era: Advancing Standards for Chiplets, Heterogeneous Integration, and System-Level Validation
Location: North Building, 100 Level, Ballroom 120BC
Panel Moderator (TV): Gaurav Verma – Qualcomm
Panelist (TV): Marc Hutner – Siemens EDA
Panelist (TV): Rich Lathrop – Advantest
Panelist (TV): Jeorge S. Hurtarte, PhD, MBA – Teradyne
Panelist (TV): Aasutosh Dave – FormFactor
Test Vision
Thursday, Oct 9th
4:00pm - 4:05pm MT
Closing Remarks
Location: North Building, 100 Level, Ballroom 120BC
Session Moderator (TV): Gaurav Verma – Qualcomm
Test Vision