Test Vision: Day 1 - Session 2: Test Development

Session Moderator (TV)(s)

• 

  Lauren Getz

  Product Manager
  Teradyne
  Somerville, MA, United States

Test: Advancing Together with Innovation

The Test Vision Symposium at SEMICON WEST is where semiconductor test experts and visionaries unite to shape the future of testing. This year’s theme, "Test: Advancing Together with Innovation," emphasizes the collaborative and innovative spirit driving advancements in semiconductor testing.

Semiconductors are the lifeblood of groundbreaking technologies, from autonomous vehicles and renewable energy to AI-powered systems and next-generation consumer electronics. Testing is essential to ensure these innovations meet the highest standards of reliability, quality, and performance. It goes beyond defect detection, driving advancements in production efficiency, design optimization, and cost reduction—all critical for the broader adoption of semiconductors across diverse applications.

The rapid evolution of semiconductor technologies demands innovative testing approaches. As we embrace challenges such as heterogeneous integration, wide-bandgap materials, THz RF frequencies, and highly complex safety-critical systems, collaboration becomes paramount. By working together, the industry can address the increasing complexity of test and pave the way for innovation in both design and manufacturing processes.

Test Vision 2025 creates a platform for open dialogue, knowledge sharing, and a forward-looking perspective on testing. This year’s symposium celebrates the spirit of partnership and ingenuity, welcoming abstracts on all topics related to semiconductor test. Join us to explore how collaboration and innovation are advancing the future of testing.

Presentations:

• 1:30pm - 1:45pm MT

  The Changing Culture of Test
  

  Speaker (TV): Ken Lanier – Teradyne
• 1:45pm - 2:00pm MT

  Implementing Effective Test Limits for Rapid Root-Cause Analysis in RMA Investigations
  

  Speaker (TV): Hailin Wang – ElevATE Semiconductor

  Speaker (TV): David Chang – ElevATE Semiconductor
• 2:15pm - 2:30pm MT

  DFT Architecture Enabling Adaptive Test
  

  Speaker (TV): Preston McWithey – Siemens EDA

  Speaker (TV): Steve Palosh – Siemens EDA

  Speaker (TV): Pete Orlando – Siemens EDA
• 2:30pm - 2:45pm MT

  Using AI to Test AI: Accelerating Hill Climbing with Automated Evaluation of RAG-Based LLM Agents
  

  Speaker (TV): Brian Buras – Advantest
• 2:45pm - 3:00pm MT

  Session 2 review + Raffle
  

  Session Moderator (TV): Robert Schneider – Advantest
• 3:00pm - 3:10pm MT

  CAST Update: Metrology & AI Working Group
  

  Speaker (TV): Basak Ulutas Ozturkler – SEMI