The integration of optical components onto a single chip—commonly known as silicon photonics (SiPh)—opens up significant opportunities for high-speed data transmission, sensing, and other advanced applications. However, this integration also introduces new technical challenges, particularly in the testing and characterization phases. Effective wafer-level probing of photonic devices is essential for measuring device performance accurately, which is critical for moving from initial design concepts through qualification and into high-volume manufacturing. In early-stage laboratory environments, testing a single prototype device typically involves meticulous setup and realignment, often taking minutes or hours per device. While this approach is manageable during development, it becomes impractical for large-scale production, where cycle time and throughput are paramount. To meet the demands of volume manufacturing, a flexible and highly efficient probing platform is necessary—one that can be quickly adapted to different device architectures, applications, and testing parameters. FormFactor’s wafer probing systems are designed with this flexibility in mind. They offer a broad range of configurable parameters enabling testing across various modalities, including optical, radio frequency (RF), direct current (DC), wafer-level, and die-level measurements. The platform supports different coupling methods such as surface and edge coupling, as well as probe card configurations, all while maintaining stringent alignment accuracy and repeatability. Maintaining high alignment precision, throughput, and stable power coupling are essential to ensure reliable and repeatable measurements. As silicon photonics applications transition from experimental and prototype environments into mass production, continuous technological advancements are vital. FormFactor has been actively developing innovations to address these evolving needs, ensuring that the industry can scale photonic devices efficiently without compromising quality or performance.
