Rising demand for bandwidth and energy efficiency—driven by generative AI—is refocusing the industry on Silicon Photonics (SiPh) and Co-packaged Optics (CPO) as critical technologies for next-generation data centers architecture. However, adoption has been delayed by the lack of fully automated, scalable tools for electro-optical wafer-level testing. Key challenges include precise fiber alignment and reliable optical interconnect handling during high-throughput testing. As large-scale deployment becomes urgent, efforts to close these automation gaps are gaining momentum to realize the full potential of SiPh and CPO in high-performance computing environments. A typical SiPh/CPO manufacturing flow includes multiple test insertions, each with unique challenges. Insertions 1 and 2 (for PIC and integrated EIC-PIC) involve wafer-level probing, either single- or double-sided. Insertion 3 tests the singulated-die level (optical engine), and insertion 4 tests the entire module after co-packaging with network switches or xPUs. To overcome the probing and handling challenges in SiPh and CPO testing, tool vendors must collaborate to create a robust manufacturing ecosystem. Advantest and FormFactor have partnered to develop the V93000-Triton Photonic Test System, a novel test cell optimized for high-volume, single-sided wafer-level probing. This integrated solution combines leading technologies from both companies to support scalable production of photonic devices. 1. Proven alignment, minimizing risk Triton uses the industry-leading Pharos™ probes and Velox™-based software from the CM300xi-SiPh prober, ensuring consistent alignment and easing the transition from engineering to high-volume production. 2. Automation-ready for manufacturing at scale Unlike lab-oriented optical probe systems, Triton is designed for manufacturing, integrating the TEL Prexa™ prober for fully automated wafer handling, probe card changes, and a streamlined SiPh production UI—proven in high-volume environments. 3. One command center for all test cell control The Advantest SmarTest 8 platform centralizes control of the test cell, integrating Triton, V93000 instruments, and various external optical measurement tools. In summary, the test cell enables reliable, low-loss wafer-level coupling and high-throughput testing. Leveraging V93000 SmarTest software, it supports high-volume optical and electrical device testing for HPC, AI, and data center applications.. An alternative to traditional fiber alignment is the electro-optical probe card, such as Jenoptik’s “UFO™,” which integrates electrical and optical probes for simultaneous wafer-level testing of Photonic Integrated Circuits (PICs). Featuring a robust, alignment-insensitive optical module optimized for grating couplers, it simplifies the test setup and boosts throughput using standard electrical probers. Advantest and Jenoptik have partnered to validate this approach, combining the V93000 test system with the UFO™ probe card to demonstrate production-ready performance. Advantest partners with third-party optical instrument vendors and enables seamless integration through its Optical Instrument Control Library—a Java-based extension for the SmarTest 8 environment. This library supports key command sets and routines, offering a flexible, scalable solution for diverse test setups.. As a market leader in HPC and AI, Advantest is committed to addressing evolving test challenges with a holistic approach across the semiconductor manufacturing flow. Leveraging in-house expertise in device handling, sockets, and DUT interfacing, Advantest collaborates closely with industry partners to co-develop solutions for current and future needs.
