Director, Probe BU Product Marketing
FormFactor
Livermore, CA, United States
Alan Liao is a seasoned expert in semiconductor test technologies, with over 20 years of experience in the probe card industry. He holds a Master of Science in Analog Circuit Design from San Jose State University and a Bachelor of Science in Electrical Engineering from the University of California, Los Angeles.
Mr. Liao joined FormFactor in 2008 as a Design Engineer, where he led the development of 300mm full-wafer contact probe cards for LPDDR testing. In 2014, he transitioned into the Product Marketing group within the Probes Business Unit, driving innovation in automotive test solutions, business development across the Asian SoC market, and high-speed probe card technologies for HBM Known Good Die (KGD) testing.
His current focus includes advanced test solutions for HBM, heterogeneous integration, and quantum computing ICs. Actively contributes to industry advancement as a Chairman of the 2026 SEMICON West Test Vision Symposium and the IEEE Heterogeneous Integration Testing Roadmap.
Wednesday, October 8, 2025
9:00am - 9:10am MT