Academician and Sr. Director
TSMC
San Jose, CA, United States
Dr. Sandeep K Goel is an academician and senior director at Taiwan Semiconductor Manufacturing Company (TSMC), USA. He previously held research and management roles at LSI, Magma Design Automation, and Philips Research. Dr. Goel earned his M.Tech. in VLSI from IIT Delhi in 1999 and his Ph.D. in Electrical and Computer Engineering from the University of Twente in 2005. He has co-authored multiple book chapters, published over 90 conference/journal papers, and holds more than 100 US patents. He received the Most Significant Paper Award at ITC in 2010 and the Distinguished Contributor Award from the IEEE Computer Society in 2022. He is the chair of IEEE Std. P3537 standard for 3Dblox: Chiplet connectivity and physical properties description language. His research focuses on design verification, testing, diagnosis, and defect modeling of 2D/3D SOCs.
Leveraging ML to Detect Defective Dies in 3D Integrated Chips (3DICs)
Thursday, October 9, 2025
11:00am - 11:15am MT