Analog-to-Digital Converters (ADCs) and Digital-to-Analog Converters (DACs) are fundamental components in modern signal processing, bridging the critical gap between analog and digital domains across diverse applications like audio, telecommunications, and data acquisition. Ensuring the high precision and reliability of these devices is paramount, as even minor inaccuracies can propagate and severely impact device performance. This speech will explore advanced test methodologies crucial for verifying the performance of both ADCs and DACs. We will delve into key parameters such as sample rate, bit resolution, THD, SNR, INL, DNL, ENOB, and jitter, and examine how specific test techniques are tailored to different application requirements (e.g., video, imaging, audio). The presentation will cover widely adopted static test methods for ADCs, including the linear ramp and sinusoidal input histogram tests for DNL and INL characterization. For dynamic ADC testing, we will discuss the impact and mitigation of various noise sources, including jitter on digital signals, waveform generator noise, and power supply/voltage reference noise, emphasizing the need for low-jitter and high-SNR test equipment. Furthermore, the presentation will detail DAC testing, which, while generally less complex, demands exceptional precision. We will highlight techniques such as the Pedestal Test and the Bucking Source Differential Amplifier, which significantly enhance measurement accuracy for DNL and INL, crucial for detecting subtle performance deviations. The discussion will conclude with an overview of how state-of-the-art test solutions integrate high-accuracy digital channels, superior signal-to-noise ratios, and low total harmonic distortion to meet the rigorous demands of comprehensive ADC and DAC testing, ensuring robust data conversion in today's high-performance electronic systems.
