The increasing diversity of semiconductor devices, including digital, RF, HPC, and mobile power, demands test solutions that are both precise and adaptable. While each domain presents unique challenges, all require power delivery that is simple, accurate, and flexible. DC instrumentation with floating power capabilities addresses this need by enhancing the configurability of general-purpose test setups and enabling advanced mobile power validation. Floating power instruments allow test engineers to streamline test architectures and improve measurement fidelity. By integrating these instruments into standard ATE configurations and employing creative connection strategies, engineers can execute a wide range of test methodologies. Key applications include: Reducing pin count and managing supply sequencing in high-voltage environments Eliminating common-mode errors in offset and gain characterization Performing high-accuracy mid-supply offset measurements Capturing fast, low-level leakage currents with minimal noise This presentation will explore implementation strategies, performance benchmarks, and real-world use cases demonstrating the transformative impact of floating power instrumentation in semiconductor test.
