Abstract The automotive industry's rapid evolution toward electrification and advanced driver assistance systems (ADAS) has dramatically increased demands for semiconductor components capable of withstanding extreme operating conditions while maintaining uncompromising reliability. This poster introduces Whitney, Elevate Semiconductor's innovative two-channel high voltage parametric measurement unit (PMU) System-on-a-Chip, designed specifically to address the rigorous testing requirements of high reliability automotive integrated circuits operating at voltages approaching up to 100V. Modern electric vehicles incorporate power management systems operating at increasingly higher voltages, with 48V systems becoming standard and full EV powertrains utilizing voltages of 400-800V. This evolution necessitates test equipment capable of characterizing device performance across expanded voltage ranges while maintaining precise measurement accuracy. Whitney delivers this capability through its unique stackable architecture, achieving test voltages suitable for next-generation automotive applications while preserving 0.05% measurement accuracy.
Elevate Semiconductor's solution implements a floating DUT configuration where two Whitney ICs can be stacked, with each channel operating in Master Mode to regulate either positive or negative voltages relative to adjacent channels. This configuration enables comprehensive four-quadrant testing critical for automotive qualification procedures. The comprehensive integration of six 16-bit DACs per channel enables Whitney to simultaneously force voltage on one channel, force current while doing measure voltage or measure current, and perform window compare measurements - all essential functions for characterizing automotive-grade semiconductors. With SPI interface speeds up to 50MHz, the Whitney significantly reduces test time without compromising measurement integrity, addressing a critical challenge in high-volume automotive semiconductor production. This poster will demonstrate how Elevate Semiconductor's Whitney platform enables automotive IC manufacturers to perform rigorous qualification testing of high voltage components while maintaining the throughput necessary for competitive manufacturing environments. We will present measurement data demonstrating how stacked Whitney configurations maintain measurement fidelity across extended voltage ranges, with particular emphasis for Automotive Semiconductor IC grade testing. The culmination of these capabilities positions Whitney as an essential tool for qualifying the next generation of high reliability automotive semiconductors, ensuring they meet the exacting standards necessary for safe operation throughout their service lifetime in demanding automotive environments. As vehicle architecture continues evolving toward higher voltage platforms, Elevate Semiconductor's solution provides manufacturers with the testing infrastructure necessary to validate component reliability while accelerating time-to-market for critical automotive systems.
